Differentiation of optical signals using an integrated metal-dielectric-metal structure

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Abstract

We consider optical properties of integrated metal-dielectric-metal structures embedded in a dielectric slab waveguide and their application to the problems of first- and second-order optical differentiation of the profile of the incident optical beam in reflection. According to the presented numerical simulation results, the investigated structures enable performing the spatial differentiation operation with high quality. The presented results may find application in novel systems for optical information processing and analog optical computing based on integrated nanophotonic structures.

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About the authors

A. I. Kashapov

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Author for correspondence.
Email: ar.kashapov@outlook.com
Russian Federation, Samara; Samara

E. A. Bezus

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Russian Federation, Samara; Samara

D. A. Bykov

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Russian Federation, Samara; Samara

L. L. Doskolovich

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Russian Federation, Samara; Samara

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Supplementary files

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2. Fig. 1. Geometry of single (a) and “double” (b) integral MDM structures, as well as a schematic representation of the calculation of the first spatial derivative of a single MDM structure (a).

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3. Fig. 2. Beam profiles for the width σ = 10 μm (dashed blue line) and σ = 50 μm (solid line) reflected from the integrated MDM structure with metal strips of gold (a) and chromium (b); the analytical function corresponding to the derivative (9) (dashed black line).

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4. Fig. 3. The PF modulus of the investigated double integral MDM structure (solid line) (4) and the normalized spectrum of the incident beam profile (5) (dashed line) (a); the numerically calculated profile of the reflected beam by the method [13] (solid line) and the analytical function corresponding to the second derivative (10) (dashed line) (b).

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