Influence of the molar ratio Sr:Bi:Ta in bismuth-strontium tantalum films SryBi2+xTa2O9 on structure and electrophysical properties

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Polycrystalline thin films of bismuth-strontium tantalum SryBi2+xTa2O9 with different molar ratio Sr:Bi:Ta were obtained by sol-gel method. The formation of a phase with a perovskite structure has been established. Phase transitions have been confirmed by dielectric spectroscopy. In the mode of polarization switching spectroscopy, remnant piezoelectric hysteresis loops were obtained, which confirms the ferroelectric nature of the synthesized SryBi2+xTa2O9 films.

作者简介

D. Kiselev

Kotel’nikov Institute of Radio Engineering and Electronics (Fryazino Branch), Russian Academy of Sciences; National University of Science and Technology “MISIS”

Email: gvc@ms.ire.rssi.ru
俄罗斯联邦, Fryazino, 141190; Moscow, 119049

E. Kurteva

National University of Science and Technology “MISIS”

Email: gvc@ms.ire.rssi.ru
俄罗斯联邦, Moscow, 119049

A. Semchenko

F. Skorina Gomel State University

Email: gvc@ms.ire.rssi.ru
白俄罗斯, Gomel, 246028

A. Boiko

Sukhoi State Technical University of Gomel

Email: gvc@ms.ire.rssi.ru
白俄罗斯, Gomel, 246746

L. Sudnik

Powder Metallurgy Institute, Research Institute of Impulse Processes with Pilot Production

Email: gvc@ms.ire.rssi.ru
俄罗斯联邦, Minsk, 220034

G. Chucheva

Kotel’nikov Institute of Radio Engineering and Electronics (Fryazino Branch), Russian Academy of Sciences

编辑信件的主要联系方式.
Email: gvc@ms.ire.rssi.ru
俄罗斯联邦, Fryazino, 141190

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